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Kelvin Probe Force Microscopy
From Single Charge Detection to Device Characterization
- Book 65 -
- Springer Series in Surface Sciences
2018
EN
This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a ...
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