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Electromigration Inside Logic Cells

Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS

Gracieli Posser,Sachin S. Sapatnekar,Ricardo Reis

Engineering (R0)

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Jazyk:English
ISBN:9783319488998
Datum vydání:1. 12. 2016
Vydavatel:Springer International Publishing

Tiráž:Springer
Formát souboru:EPUB2
Velikost souboru:3.10 MB
Možnosti stahování:EPUB2 (Adobe DRM)

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Nastavení ochrany vašich osobních údajů

Electromigration Inside Logic Cells

Synopse

O knize

Podrobnosti o knize

Jak číst

Související čtení

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Hybrid ADCs, Smart Sensors for the IoT, and Sub-1V & Advanced Node Analog Circuit Design

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