Active Probe Atomic Force Microscopy

A Practical Guide on Precision Instrumentation

Fangzhou Xia,Ivo W. Rangelow,Kamal Youcef-Toumi

Physics and Astronomy (R0)

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言語　English
商品番号：9783031442339
発売日　2024年2月6日
出版社：Springer International Publishing

出版社： Springer
ファイル形式　EPUB3
サイズ　51.27 MB
ダウンロードオプション:EPUB3 (Adobe DRM)

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関連書籍

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