This is our Philippines store.

Looks like you're in United States. You need a Philippines address to shop on our Philippines store. Go to our United States store to continue.

Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies eBook by Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel

Advanced Test Methods for SRAMs

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Synopsis

Categories

About this book

  • Language:English
  • ISBN:9781441909381
  • Release date:Jul 5, 2016
  • Publisher:Springer US
  • Imprint:Springer
  • File format:EPUB2
  • File size:1.89 MB
  • Download options:EPUB2 (Adobe DRM)

In this series

Approximate Computing Techniques

Alberto Bosio,Daniel Ménard,Olivier Sentieys