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  • Noise in Nanoscale Semiconductor Devices

    Edición de Tibor Grasser ...
    Series series Engineering (R0)
    This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more ... Leer más

    $1,656 MXN

  • Hot Carrier Degradation in Semiconductor Devices

    Edición de Tibor Grasser ...
    Series series Engineering (R0)
    This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, ... Leer más

    $1,840 MXN

  • Bias Temperature Instability for Devices and Circuits

    Edición de Tibor Grasser ...
    Series series Engineering (R0)
    This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, ... Leer más

    $1,840 MXN

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  • Advanced Materials

    Techniques, Physics, Mechanics and Applications

    Series series Springer Nature Proceedings excluding Computer Science
    This book presents 50 selected peer-reviewed reports from the 2016 International Conference on “Physics and Mechanics of New Materials and Their Applications”, PHENMA 2016 (Surabaya, Indonesia, 19–22 July, 2016). The Proceedings are devoted to processing techniques, physics, mechanics, and applications of advanced materials. As such, they examine a wide spectrum of nanostructures, ferroelectric ... Leer más

    $5,317 MXN

  • Analog Dialogue, Volume 48, Number 1

    Analog Dialogue, #13

    Series Libro 13 - Analog Dialogue
    Analog Dialogue -- A Forum for the Exchange of Circuits, Systems, and Software for Real-World Signal Processing Analog Dialogue is the technical magazine of Analog Devices. It discusses products, applications, technology, and techniques for analog, digital and mixed-signal processing. This is Volume 48, Number 1, 2014 ... Leer más

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  • CMOS Test and Evaluation

    A Physical Perspective

    Series series Engineering (R0)
    CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers ... Leer más

    $2,207 MXN

  • Analog Dialogue, Volume 46, Number 4

    Analog Dialogue, #8

    Series Libro 8 - Analog Dialogue
    Analog Dialogue -- A Forum for the Exchange of Circuits, Systems, and Software for Real-World Signal Processing Analog Dialogue is the technical magazine of Analog Devices. It discusses products, applications, technology, and techniques for analog, digital and mixed-signal processing. This is Volume 46, Number 4, 2012 ... Leer más

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  • Electromigration Modeling at Circuit Layout Level

    Series series Engineering (R0)
    Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM) of interconnects has now become the dominant failure mechanism that determines the circuit reliability. This brief ... Leer más

    $920 MXN

  • Semiconductor Technologies in the Era of Electronics

    Series series Engineering (R0)
    Technological advances in the field of materials, devices, circuits, and systems began by the discovery of new properties of objects, or the entrepreneurship with the applications of unique or practical concepts for commercial goods. To implement products using these findings and challenges textbook knowledge is usually sufficient. Semiconductor Technologies in the Era of Electronics therefore ... Leer más

    $1,656 MXN

  • Research on the Radiation Effects and Compact Model of SiGe HBT

    de Yabin Sun ...
    Series series Engineering (R0)
    This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by ... Leer más

    $1,656 MXN

  • Microwave Electronics

    Series series Engineering (R0)
    This book describes the physical basis of microwave electronics and related topics, such as microwave vacuum and microwave semiconductor devices.It comprehensively discusses the main types of microwave vacuum and microwave semiconductor devices, their principles of action, theory, parameters and characteristics, as well as ways of increasing the frequency limit of various devices up to the ... Leer más

    $2,024 MXN

  • Advanced Materials for Integrated Optical Waveguides

    Series series Physics and Astronomy (R0)
    This book provides a comprehensive introduction to integrated optical waveguides for information technology and data communications. Integrated coverage ranges from advanced materials, fabrication, and characterization techniques to guidelines for design and simulation. A concluding chapter offers perspectives on likely future trends and challenges. The dramatic scaling down of feature sizes has ... Leer más

    $2,575 MXN