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  • Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits

    Serier serie Engineering (R0)
    As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits describes a statistical circuit simulation and optimization ... Læs mere

    840,47 kr.