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Noise in Nanoscale Semiconductor Devices

Redigeret af Tibor Grasser ...

Serier serie Engineering (R0)
This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more ... Læs mere

840,47 kr.

This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more
... Læs mere
Bias Temperature Instability for Devices and Circuits

Redigeret af Tibor Grasser ...

Serier serie Engineering (R0)
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, ... Læs mere

840,49 kr.

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory,
... Læs mere
Hot Carrier Degradation in Semiconductor Devices

Redigeret af Tibor Grasser ...

Serier serie Engineering (R0)
This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, ... Læs mere

840,49 kr.

This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors,
... Læs mere

Advanced Materials

Techniques, Physics, Mechanics and Applications

Redigeret af Ivan A. Parinov, Shun-Hsyung Chang, Muaffaq A. Jani ...

Serier serie Springer Nature Proceedings excluding Computer Science
This book presents 50 selected peer-reviewed reports from the 2016 International Conference on “Physics and Mechanics of New Materials and Their Applications”, PHENMA 2016 (Surabaya, Indonesia, 19–22 July, 2016). The Proceedings are devoted to processing techniques, physics, mechanics, and applications of advanced materials. As such, they examine a wide spectrum of nanostructures, ferroelectric ... Læs mere

2.699,15 kr.

This book presents 50 selected peer-reviewed reports from the 2016 International Conference on “Physics and Mechanics of New Materials and Their Applications”, PHENMA 2016 (Surabaya, Indonesia, 19–22 July, 2016). The Proceedings are devoted to processing techniques, physics, mechanics, and applications of advanced materials. As such, they examine a wide spectrum of nanostructures, ferroelectric
... Læs mere
CMOS Test and Evaluation

A Physical Perspective

af Manjul Bhushan, Mark B. Ketchen ...

Serier serie Engineering (R0)
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers ... Læs mere

1.120,66 kr.

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers
... Læs mere
Analog Dialogue, Volume 48, Number 1

Analog Dialogue, #13

af Analog Dialogue ...

Serier Bog 13 - Analog Dialogue
Analog Dialogue -- A Forum for the Exchange of Circuits, Systems, and Software for Real-World Signal Processing Analog Dialogue is the technical magazine of Analog Devices. It discusses products, applications, technology, and techniques for analog, digital and mixed-signal processing. This is Volume 48, Number 1, 2014 ... Læs mere

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Analog Dialogue -- A Forum for the Exchange of Circuits, Systems, and Software for Real-World Signal Processing Analog Dialogue is the technical magazine of Analog Devices. It discusses products, applications, technology, and techniques for analog, digital and mixed-signal processing. This is Volume 48, Number 1, 2014
... Læs mere
Semiconductor Technologies in the Era of Electronics

af Yong Hoon Kang ...

Serier serie Engineering (R0)
Technological advances in the field of materials, devices, circuits, and systems began by the discovery of new properties of objects, or the entrepreneurship with the applications of unique or practical concepts for commercial goods. To implement products using these findings and challenges textbook knowledge is usually sufficient. Semiconductor Technologies in the Era of Electronics therefore ... Læs mere

756,49 kr.

Technological advances in the field of materials, devices, circuits, and systems began by the discovery of new properties of objects, or the entrepreneurship with the applications of unique or practical concepts for commercial goods. To implement products using these findings and challenges textbook knowledge is usually sufficient. Semiconductor Technologies in the Era of Electronics therefore
... Læs mere
Electromigration Modeling at Circuit Layout Level

af Feifei He, Cher Ming Tan ...

Serier serie Engineering (R0)
Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM) of interconnects has now become the dominant failure mechanism that determines the circuit reliability. This brief ... Læs mere

466,89 kr.

Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM) of interconnects has now become the dominant failure mechanism that determines the circuit reliability. This brief
... Læs mere
Analog Dialogue, Volume 46, Number 4

Analog Dialogue, #8

af Analog Dialogue ...

Serier Bog 8 - Analog Dialogue
Analog Dialogue -- A Forum for the Exchange of Circuits, Systems, and Software for Real-World Signal Processing Analog Dialogue is the technical magazine of Analog Devices. It discusses products, applications, technology, and techniques for analog, digital and mixed-signal processing. This is Volume 46, Number 4, 2012 ... Læs mere

Gratis

Analog Dialogue -- A Forum for the Exchange of Circuits, Systems, and Software for Real-World Signal Processing Analog Dialogue is the technical magazine of Analog Devices. It discusses products, applications, technology, and techniques for analog, digital and mixed-signal processing. This is Volume 46, Number 4, 2012
... Læs mere
Research on the Radiation Effects and Compact Model of SiGe HBT

af Yabin Sun ...

Serier serie Engineering (R0)
This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by ... Læs mere

756,49 kr.

This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by
... Læs mere
Microwave Electronics

af Andrey D. Grigoriev, Vyacheslav A. Ivanov, Sergey I. Molokovsky ...

Serier serie Engineering (R0)
This book describes the physical basis of microwave electronics and related topics, such as microwave vacuum and microwave semiconductor devices.It comprehensively discusses the main types of microwave vacuum and microwave semiconductor devices, their principles of action, theory, parameters and characteristics, as well as ways of increasing the frequency limit of various devices up to the ... Læs mere

924,61 kr.

This book describes the physical basis of microwave electronics and related topics, such as microwave vacuum and microwave semiconductor devices.It comprehensively discusses the main types of microwave vacuum and microwave semiconductor devices, their principles of action, theory, parameters and characteristics, as well as ways of increasing the frequency limit of various devices up to the
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Advanced Materials for Integrated Optical Waveguides

af Xingcun Colin Tong Ph.D ...

Serier serie Physics and Astronomy (R0)
This book provides a comprehensive introduction to integrated optical waveguides for information technology and data communications. Integrated coverage ranges from advanced materials, fabrication, and characterization techniques to guidelines for design and simulation. A concluding chapter offers perspectives on likely future trends and challenges. The dramatic scaling down of feature sizes has ... Læs mere

1.176,74 kr.

This book provides a comprehensive introduction to integrated optical waveguides for information technology and data communications. Integrated coverage ranges from advanced materials, fabrication, and characterization techniques to guidelines for design and simulation. A concluding chapter offers perspectives on likely future trends and challenges. The dramatic scaling down of feature sizes has
... Læs mere

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Engineering (R0) Bogserier

Noise in Nanoscale Semiconductor Devices

Bias Temperature Instability for Devices and Circuits

Hot Carrier Degradation in Semiconductor Devices

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Advanced Materials

CMOS Test and Evaluation

Analog Dialogue, Volume 48, Number 1

Semiconductor Technologies in the Era of Electronics

Electromigration Modeling at Circuit Layout Level

Analog Dialogue, Volume 46, Number 4

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Microwave Electronics

Advanced Materials for Integrated Optical Waveguides