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Nano-Electronic Devices

Semiclassical and Quantum Transport Modeling

Edición de Dragica Vasileska, Stephen M. Goodnick ...

Series series Engineering (R0)
This book surveys the advanced simulation methods needed for proper modeling of state-of-the-art nanoscale devices. It systematically describes theoretical approaches and the numerical solutions that are used in explaining the operation of both power devices as well as nano-scale devices. It clearly explains for what types of devices a particular method is suitable, which is the most critical ... Leer más

$2,759 MXN

This book surveys the advanced simulation methods needed for proper modeling of state-of-the-art nanoscale devices. It systematically describes theoretical approaches and the numerical solutions that are used in explaining the operation of both power devices as well as nano-scale devices. It clearly explains for what types of devices a particular method is suitable, which is the most critical
... Leer más

A Practical Introduction to Hardware/Software Codesign

de Patrick R. Schaumont ...

This is a practical book for computer engineers who want to understand or implement hardware/software systems. It focuses on problems that require one to combine hardware design with software design – such problems can be solved with hardware/software codesign. When used properly, hardware/software co- sign works better than hardware design or software design alone: it can improve the overall ... Leer más

$1,083 MXN

This is a practical book for computer engineers who want to understand or implement hardware/software systems. It focuses on problems that require one to combine hardware design with software design – such problems can be solved with hardware/software codesign. When used properly, hardware/software co- sign works better than hardware design or software design alone: it can improve the overall
... Leer más
Formal Development of a Network-Centric RTOS

Software Engineering for Reliable Embedded Systems

de Eric Verhulst, Raymond T. Boute, José Miguel Sampaio Faria, Bernhard H.C. Sputh, Vitaliy Mezhuyev ...

Series series Engineering (R0)
Many systems, devices and appliances used routinely in everyday life, ranging from cell phones to cars, contain significant amounts of software that is not directly visible to the user and is therefore called "embedded". For coordinating the various software components and allowing them to communicate with each other, support software is needed, called an operating system (OS). Because embedded ... Leer más

$1,840 MXN

Many systems, devices and appliances used routinely in everyday life, ranging from cell phones to cars, contain significant amounts of software that is not directly visible to the user and is therefore called "embedded". For coordinating the various software components and allowing them to communicate with each other, support software is needed, called an operating system (OS). Because embedded
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SystemVerilog for Verification

A Guide to Learning the Testbench Language Features

de Chris Spear, Greg Tumbush ...

Series series Engineering (R0)
Based on the highly successful second edition, this extended edition of SystemVerilog for Verification: A Guide to Learning the Testbench Language Features teaches all verification features of the SystemVerilog language, providing hundreds of examples to clearly explain the concepts and basic fundamentals. It contains materials for both the full-time verification engineer and the student learning ... Leer más

$1,196 MXN

Based on the highly successful second edition, this extended edition of SystemVerilog for Verification: A Guide to Learning the Testbench Language Features teaches all verification features of the SystemVerilog language, providing hundreds of examples to clearly explain the concepts and basic fundamentals. It contains materials for both the full-time verification engineer and the student learning
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Advanced Test Methods for SRAMs

Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

de Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel ...

Series series Engineering (R0)
Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for ... Leer más

$1,656 MXN

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for
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Principles of VLSI RTL Design

A Practical Guide

de Sanjay Churiwala, Sapan Garg ...

Series series Engineering (R0)
Since register transfer level (RTL) design is less about being a bright engineer, and more about knowing the downstream implications of your work, this book explains the impact of design decisions taken that may give rise later in the product lifecycle to issues related to testability, data synchronization across clock domains, synthesizability, power consumption, routability, etc., all which are ... Leer más

$1,656 MXN

Since register transfer level (RTL) design is less about being a bright engineer, and more about knowing the downstream implications of your work, this book explains the impact of design decisions taken that may give rise later in the product lifecycle to issues related to testability, data synchronization across clock domains, synthesizability, power consumption, routability, etc., all which are
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Ultra-thin Chip Technology and Applications

Edición de Joachim Burghartz ...

Series series Engineering (R0)
Ultra-thin chips are the "smart skin" of a conventional silicon chip. This book shows how very thin and flexible chips can be fabricated and used in many new applications in microelectronics, Microsystems, biomedical and other fields. It provides a comprehensive reference to the fabrication technology, post processing, characterization and the applications of ultra-thin chips. ... Leer más

$1,656 MXN

Ultra-thin chips are the "smart skin" of a conventional silicon chip. This book shows how very thin and flexible chips can be fabricated and used in many new applications in microelectronics, Microsystems, biomedical and other fields. It provides a comprehensive reference to the fabrication technology, post processing, characterization and the applications of ultra-thin chips.
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Power-Aware Testing and Test Strategies for Low Power Devices

Edición de Patrick Girard, Nicola Nicolici, Xiaoqing Wen ...

Series series Engineering (R0)
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on ... Leer más

$1,840 MXN

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on
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Process Variations and Probabilistic Integrated Circuit Design

Edición de Manfred Dietrich, Joachim Haase ...

Series series Engineering (R0)
Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book ... Leer más

$1,656 MXN

Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book
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Voltage Regulators for Next Generation Microprocessors

de Toni López, Reinhold Elferich, Eduard Alarcón ...

Series series Engineering (R0)
This book deals with energy delivery challenges of the power processing unit of modern computer microprocessors. It describes in detail the consequences of current trends in miniaturization and clock frequency increase, upon the power delivery unit, referred to as voltage regulator. This is an invaluable reference for anybody needing to understand the key performance limitations and opportunities ... Leer más

$1,840 MXN

This book deals with energy delivery challenges of the power processing unit of modern computer microprocessors. It describes in detail the consequences of current trends in miniaturization and clock frequency increase, upon the power delivery unit, referred to as voltage regulator. This is an invaluable reference for anybody needing to understand the key performance limitations and opportunities
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Nanoscale Memory Repair

de Masashi Horiguchi, Kiyoo Itoh ...

Series series Engineering (R0)
Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low ... Leer más

$1,840 MXN

Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low
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Carbon Nanotube Electronics

Edición de Jing Kong, Ali Javey ...

Series series Engineering (R0)
As the scaling limits of the conventional Si technology is approached, many have pursued alternative and revolutionary concepts as means to further improve the performance of future electronics. One such concept invovles the integration of carbon nanotube building blocks for active and passive components. The field of carbon nanotube electronics has recently received substantial attention from the ... Leer más

$1,840 MXN

As the scaling limits of the conventional Si technology is approached, many have pursued alternative and revolutionary concepts as means to further improve the performance of future electronics. One such concept invovles the integration of carbon nanotube building blocks for active and passive components. The field of carbon nanotube electronics has recently received substantial attention from the
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A Practical Introduction to Hardware/Software Codesign

Formal Development of a Network-Centric RTOS

SystemVerilog for Verification

Advanced Test Methods for SRAMs

Principles of VLSI RTL Design

Ultra-thin Chip Technology and Applications

Power-Aware Testing and Test Strategies for Low Power Devices

Process Variations and Probabilistic Integrated Circuit Design

Voltage Regulators for Next Generation Microprocessors

Nanoscale Memory Repair

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