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Methods, Models and Applications
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Jeffrey Yi-Lin Forrest, Jeananne Nicholls, Kurt Schimmel, Sifeng Liu
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$86.99
Zhigeng Fang, Sifeng Liu, Hongxing Shi, Yi Lin
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James E. Lukaszewski, ABC, APR, Fellow PRSA, Kristen Noakes-Fry, ABCI
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John Bessant, Peter Augsdorfer, Bettina Von Stamm, Kathrin Moslein, Frank T Piller
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Isabelle Linden, Shaofeng Liu, Fátima Dargam, Jorge E. Hernández
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Xin-She Yang, Sinan Melih Nigdeli, Gebrail Bekdaş
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